Thermal stresses mostly affect the life of a semiconductor device, among electrical, thermal, and mechanical stresses. The Arrhenius chemical reaction theorem has been proved to be useful for estimating the dependency of the response speed on thermal stress, and this theorem is used to expect the life of a semiconductor device.
|Ea:||Energy of activation [eV]|
|k:||Boltzman constant (8.6159 × 10-5 [eV/K])|
|T:||Absolute temperature [K]|
For details, refer to the Review of Quality and Reliability Handbook.